Q. Mottling due to X ray diffraction can be identified by: (Solved)
1. Noting a large change between two successive exposures with the test piece rotated slightly about the beam axis
2. Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis
3. Noting a characteristic pattern corresponding to the lattice spacing
4. None of the above
- b. Noting a slight change between two successive exposures with the test piece rotated slightly about the beam axis